DocumentCode
2598152
Title
Applicatiorn of the Electron Microprobe Analyzer to the Study of Silicon Switching Diodes
Author
Pietrokowsky, Paul
Author_Institution
North American Aviation, Inc., Autonetics, Anaheim, California
fYear
1963
fDate
Sept. 1963
Firstpage
245
Lastpage
267
Keywords
Atomic measurements; Electron beams; Instruments; Particle scattering; Physics; Semiconductor diodes; Semiconductor impurities; Silicon; Solid state circuits; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362249
Filename
4207600
Link To Document