DocumentCode :
2598971
Title :
Advanced techniques for aerospace materials testing
Author :
Gregorwich, W. ; Elgin, D.
Author_Institution :
Lockheed Missiles & Space Co., Sunnyvale, CA, USA
fYear :
1991
fDate :
3-8 Feb. 1991
Firstpage :
42491
Lastpage :
510
Abstract :
Three non-destructive tests are described for the characterization of large thick sheets of substrate materials, such as Shuttle tile. The tests are real-time X-ray imaging, automated millimeter-wave testing, and high-temperature testing using a high-power CO/sub 2/ laser. These methods allow substrate evaluation before use in the manufacture of electronic or electrooptic components. Besides defining the electrical properties, the tests detect perturbations in the substrate smaller than 0.03 in. The electrical performance can be measured at temperatures exceeding 3000 degrees F.<>
Keywords :
X-ray applications; aerospace testing; automatic testing; carbon compounds; gas lasers; high-temperature techniques; measurement by laser beam; microwave measurement; nondestructive testing; substrates; 0.03 inch; 3000 F; CO/sub 2/ laser; Shuttle tile; aerospace materials testing; automated millimeter-wave testing; electrical properties; electronic components; electrooptic components; high-temperature testing; microwave measurement; perturbations; real-time X-ray imaging; substrate; thick sheets; Aerospace materials; Aerospace testing; Automatic testing; Materials testing; Nondestructive testing; Optical materials; Sheet materials; Temperature measurement; Tiles; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Applications Conference, 1991. Digest., 1991 IEEE
Conference_Location :
Crested Butte, CO, USA
Print_ISBN :
0-87942-686-1
Type :
conf
DOI :
10.1109/AERO.1991.154533
Filename :
154533
Link To Document :
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