Title :
A Limitation to the Step Stress Testing Concept for Integrated Circuits
Author :
Shurtleff, W. ; Workman, W.
Author_Institution :
Texas Instruments, Inc., Dallas, Texas
Keywords :
Circuit testing; DH-HEMTs; Hafnium; High definition video; Integrated circuit testing; Stress; TV;
Conference_Titel :
Physics of Failure in Electronics, 1965. Fourth Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1965.362324
