Title :
Factors Affecting the Reliability of Wet Tantalum Capacitors
Author :
Rowe, W.M. ; Eisenberg, P.H.
Author_Institution :
Autonetics Division of North American Rockwell Corporation, Anaheim, California
Keywords :
Anodes; Capacitors; Cathodes; Circuits; Coatings; Dielectric devices; Manufacturing; Packaging; Physics; Voltage;
Conference_Titel :
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/IRPS.1967.362417
