DocumentCode :
2602236
Title :
CMOS & Interconnect Reliability - Reliability Issues in Non-Volatile Memories and ESD
Author :
Reimbold, Gilles ; Gossner, Harald
Author_Institution :
CEA/LETI
fYear :
2007
fDate :
10-12 Dec. 2007
Firstpage :
155
Lastpage :
155
Keywords :
Electrostatic discharge; FETs; Fluctuations; Nonvolatile memory; Phase change memory; Probability distribution; SONOS devices; Statistical distributions; Telegraphy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-1507-6
Electronic_ISBN :
978-1-4244-1508-3
Type :
conf
DOI :
10.1109/IEDM.2007.4418889
Filename :
4418889
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2602236
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