Title :
Practical aspects of modeling apertures for signal and power integrity co-simulation
Author :
Choi, Jae Young ; Swaminathan, Madhavan
Author_Institution :
Interconnect & Packaging Center, Georgia Tech, Atlanta, GA, USA
Abstract :
When the return path of a signal is not continuous, unwanted noise will couple to the return current, leading to worsening of the signal waveform. To prevent such a signal integrity issue, a thorough understanding of the physics of the return path discontinuity (RPD) is critical. This paper presents analysis and quantification of the impact of RPDs in the presence of a power delivery network The study of the different types of RPDs, such as a gap between reference planes and an aperture, provides designing and modeling guidelines. The guidelines are applied to an efficient PDN analysis method to further improve computational efficiency.
Keywords :
distribution networks; integrated circuit modelling; integrated circuit noise; microstrip discontinuities; power integrated circuits; PDN analysis method; RPD; computational efficiency; modeling apertures; power delivery network; power integrity co-simulation; reference planes; return current; return path discontinuity; signal integrity co-simulation; signal waveform; unwanted noise; Apertures; Computational modeling; Guidelines; Impedance; Insertion loss; Microstrip; Substrates; microstrip line; power distribution network; power integrity; return path discontinuity; signal integrity;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2011 IEEE 20th Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-9398-2
Electronic_ISBN :
pending
DOI :
10.1109/EPEPS.2011.6100171