Title :
Yield prediction by sampling with the EYES tool
Author :
Allan, Gerard A. ; Walto, Anthony J.
Author_Institution :
Dept. of Electr. Eng., Edinburgh Univ., UK
Abstract :
This paper reports a software system EYES (Edinburgh Yield Estimator Sampling) for the yield prediction of ULSI devices. The system implements the survey sampling based methodology for critical area estimation and yield prediction. This methodology is not limited by the size of the device or the design hierarchy and can provide yield predictions in a reasonable time for even the largest devices, using modest computing resources
Keywords :
ULSI; integrated circuit yield; EYES tool; Edinburgh Yield Estimator Sampling; ULSI device; critical area estimation; software system; survey sampling; yield prediction; Algorithm design and analysis; Application specific integrated circuits; Estimation error; Eyes; Prediction algorithms; Robustness; Sampling methods; Software systems; Ultra large scale integration; Yield estimation;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
0-8186-7545-4
DOI :
10.1109/DFTVS.1996.571983
