Title :
Novel transient fault hardened static latch
Author :
Omaña, Martin ; Rossi, Daniele ; Metra, Cecilia
fDate :
Sept. 30-Oct. 2, 2003
Abstract :
University of Bologna
Keywords :
Aerospace electronics; Circuit faults; Error correction codes; Feedback; Inverters; Latches; Logic; Radiation hardening; Space technology; Transient analysis;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271074