DocumentCode :
2603537
Title :
Dissolution Rates and Reliability Effects of Au, Ag, Ni and Cu in Lead Base Solders
Author :
Berg, Howard ; Hall, Edward L.
Author_Institution :
Senior Engineer, Materials Research Laboratory, Motorola, Inc., 5005 E. McDowell Road, Phoenix, Arizona 85008
fYear :
1973
fDate :
26755
Firstpage :
10
Lastpage :
20
Abstract :
The rates at which Au, Ag, Cu, and Ni wires dissolved in 95wt%Pb-5%Sn and 92.5wt% Pb-5%In-2.57%Ag soft solders were measured between 360 and 500°C. The rates have an Arrhenius behavior with temperature and for both solders nickel has the lowest dissolution rate while gold has the highest. A model is discussed, using the analysis of Lommel and Chalmers, which allows prediction of relative dissolution rates into Pb-Sn solders with any composition. Small amounts of Au and Ag, purposely added to 95wt%Pb-5%Sn die bonds in test power transistors, were found to deleteriously affect the fatigue resistance of the solder as measured during power cycling. Analysis of fracture surfaces and cross sections indicated that most of the gold forms tin intermetallics at the die-solder interface while the silver dissolved into the molten solder.
Keywords :
Electrical resistance measurement; Fatigue; Gold; Lead; Nickel; Power transistors; Predictive models; Temperature; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1973.362561
Filename :
4207936
Link To Document :
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