Title :
Functional fault simulation of VHDL gate level models
Author :
Aftabjahani, Seyed Abdollah ; Navabi, Zainalabedin
Author_Institution :
Dept. of Electr. & Comput. Eng., Tehran Univ., Iran
Abstract :
A method of fault injection and fault simulation is proposed. A gate level circuit is modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations is given
Keywords :
circuit analysis computing; fault diagnosis; hardware description languages; logic gates; logic testing; VHDL gate level models; VHDL simulator; functional fault simulation; functional model; gate level circuit; logic gates; stuck-at fault injection; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Delay; Electrical fault detection; Fault detection; Logic circuits; Logic gates;
Conference_Titel :
VHDL International Users' Forum, 1997. Proceedings
Conference_Location :
Arlington, VA
Print_ISBN :
0-8186-8180-2
DOI :
10.1109/VIUF.1997.623925