Title :
WAVES: a simulation and tester view
Author :
Hillman, Robert G.
Author_Institution :
Rome Air Dev. Center, Griffiss AFB, NY, USA
Abstract :
The author describes WAVES, the Waveform and Vector Exchange Specification standard, and demonstrates its use in both a simulation and test environment. The author introduces the background of the WAVES effort, its requirements and objectives, and the general architecture of WAVES datasets. A concrete example of both simulation and tester usage is provided. A WAVES dataset describes waveforms or event streams which define the time histories of collections of logic signals. The waveform description style provided by the WAVES specification supports an information model which captures all the information in the simulator stimulus languages and tester test vector languages, including multilevel value systems, tester formats, repeat and branch capabilities, and hierarchical test organization. The WAVES representation is thus a universal acceptor for simulation and test waveform information. The use of WAVES can therefore provide a common exchange specification in a nonproprietary format, decrease the test transportation cost, improve the reliability of waveform translations, and establish an industry environment which allows for the development of standard translation and revectorization tools
Keywords :
automatic test equipment; digital simulation; high level languages; logic testing; standards; wave analysers; waveform analysis; WAVES dataset; Waveform and Vector Exchange Specification standard; architecture; event streams; hierarchical test; industry environment; information model; logic signals; multilevel value systems; reliability; revectorization; simulation environment; standard translation; stimulus languages; test environment; test transportation cost; test vector languages; tester formats; time histories; waveform translations; waveforms; Automatic testing; Computational modeling; Concrete; Corporate acquisitions; Design engineering; History; Logic testing; Physics; Standards development; System testing;
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
DOI :
10.1109/AUTEST.1990.111527