DocumentCode
260466
Title
Advantage and drawback of support vector machine functionality
Author
Karamizadeh, Sasan ; Abdullah, Shahidan M. ; Halimi, Mehran ; Shayan, Jafar ; Rajabi, Mohammad Javad
Author_Institution
Adv. Inf. Sch. (AIS), Univ. Teknol. Malayisa (UTM), Kuala Lumpur, Malaysia
fYear
2014
fDate
2-4 Sept. 2014
Firstpage
63
Lastpage
65
Abstract
Support Vector Machine(SVM)is one of the most efficient machine learning algorithms, which is mostly used for pattern recognition since its introduction in 1990s. SVMs vast variety of usage, such as face and speech recognition, face detection and image recognition has turned it into a very useful algorithm. This has also been applied to many pattern classification problems such as image recognition, speech recognition, text categorization, face detection, and faulty card detection.Statistics was collected from journals and electronic sources published in the period of 2000 to 2013. Pattern recognition aims to classify data based on either a priori knowledge or statistical information extracted from raw data, which is a powerful tool in data separation in many disciplines. The Support Vector Machine (SVM) is a kind of algorithms in biometrics. It is a statistics technical and used orthogonal transformation to convert a set of observations of possibly correlated variables into a set of values of linearly uncorrelated variables.
Keywords
biometrics (access control); learning (artificial intelligence); pattern recognition; statistical analysis; support vector machines; SVM; a-priori knowledge; biometrics; data classification; data separation; linearly uncorrelated variables; machine learning algorithms; orthogonal transformation; pattern classification problems; pattern recognition; raw data; statistical information extraction; statistics technical; support vector machine functionality; Classification algorithms; Face detection; Image recognition; Kernel; Machine learning algorithms; Pattern recognition; Support vector machines; BiometricS; Biometricupport Vector Machine; Pattern recognition; classify; face detection; upport Vector Machine;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer, Communications, and Control Technology (I4CT), 2014 International Conference on
Conference_Location
Langkawi
Print_ISBN
978-1-4799-4556-6
Type
conf
DOI
10.1109/I4CT.2014.6914146
Filename
6914146
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