DocumentCode :
2605908
Title :
From design for test to concurrent engineering
Author :
Turino, Jon
Author_Institution :
Logical Solutions Technol. Inc., Campbell, CA, USA
fYear :
1990
fDate :
17-21 Sep 1990
Firstpage :
345
Lastpage :
349
Abstract :
It is argued that design for testability will not be enough by itself in the 1990s and that the entire design philosophy must change from a serial approach to a parallel one of concurrent engineering. An outline of previous approaches is presented, exploring what has and has not worked and what is still not working. The author identifies the fundamental changes that must occur in systems engineering and the impact that design for testability, design for quality, design for manufacturability, and design for serviceability will have on the acceptance by the services of new systems designs. The concurrent engineering environment and some of the computer-aided engineering tools needed to successfully implement it are described. Some examples of the impact concurrent engineering on development times, production costs, and overall life-cycle costs are examined
Keywords :
CAD/CAM; automatic testing; economics; electronic engineering computing; electronic equipment testing; CAD; CAM; concurrent engineering; design for manufacturability; design for quality; design for serviceability; design for testability; electronics industry; life-cycle costs; production costs; systems engineering; testability; Concurrent computing; Concurrent engineering; Costs; Design engineering; Design for quality; Design for testability; Manufacturing; Production; Systems engineering and theory; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.
Conference_Location :
San Antonio, TX
Type :
conf
DOI :
10.1109/AUTEST.1990.111534
Filename :
111534
Link To Document :
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