DocumentCode :
2606452
Title :
Integrated design and test generation under internet based environment MOSCITO
Author :
Schneider, A. ; Ivask, E. ; Ubar, Raimund
Author_Institution :
Fraunhofer Inst. for Integrated Circuits
fYear :
2002
fDate :
2002
Firstpage :
187
Lastpage :
194
Abstract :
This paper describes an environment for internet-based collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.
Keywords :
Internet; VLSI; automatic test pattern generation; fault simulation; hardware description languages; integrated circuit testing; programming environments; Internet based environment MOSCITO; automatic test pattern generation; fault simulation tools; hierarchical levels; integrated design and test generation; integrated tools; system-on-chip technology; virtual environment; Automatic test pattern generation; Circuit faults; Communication system control; Design engineering; Digital systems; Electronic design automation and methodology; Internet; Java; System testing; Virtual environment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital System Design, 2002. Proceedings. Euromicro Symposium on
Print_ISBN :
0-7695-1790-0
Type :
conf
DOI :
10.1109/DSD.2002.1115368
Filename :
1115368
Link To Document :
بازگشت