DocumentCode
2607017
Title
The Role of Hybrid Construction Techniques on Sealed Moisture Levels
Author
Somerville, D.T.
Author_Institution
Rockwell International, 1200 North Alma Road, Richardson, Texas 75081. (214) 690-6438
fYear
1977
fDate
28216
Firstpage
107
Lastpage
111
Abstract
Residual gas analysis techniques are employed to measure the moisture in sealed hybrid packages as a function of substrate attach material, vacuum bake time and sequence, and sealing procedure. It is shown that, when room atmospheric exposure is eliminated following the vacuum bake-out, moisture levels of less than 1000 ppm may be achieved for modest bake times and solder substrate attach techniques. Suitable moisture levels were achieved for epoxy attached substrates only when seam sealing procedures were employed.
Keywords
Conductive films; Fabrication; Gold; Moisture; Resistors; Sealing materials; Semiconductor device packaging; Substrates; Tin; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1977. 15th Annual
Conference_Location
LAs Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1977.362779
Filename
4208166
Link To Document