• DocumentCode
    2607017
  • Title

    The Role of Hybrid Construction Techniques on Sealed Moisture Levels

  • Author

    Somerville, D.T.

  • Author_Institution
    Rockwell International, 1200 North Alma Road, Richardson, Texas 75081. (214) 690-6438
  • fYear
    1977
  • fDate
    28216
  • Firstpage
    107
  • Lastpage
    111
  • Abstract
    Residual gas analysis techniques are employed to measure the moisture in sealed hybrid packages as a function of substrate attach material, vacuum bake time and sequence, and sealing procedure. It is shown that, when room atmospheric exposure is eliminated following the vacuum bake-out, moisture levels of less than 1000 ppm may be achieved for modest bake times and solder substrate attach techniques. Suitable moisture levels were achieved for epoxy attached substrates only when seam sealing procedures were employed.
  • Keywords
    Conductive films; Fabrication; Gold; Moisture; Resistors; Sealing materials; Semiconductor device packaging; Substrates; Tin; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1977. 15th Annual
  • Conference_Location
    LAs Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1977.362779
  • Filename
    4208166