Title :
Modal analysis and dynamic responses of board level drop test
Author :
Luan, Ling-en ; Tee, Tong Yan ; Pek, Eric ; Lim, Chwee Teck ; Zhong, Zhaowei
Author_Institution :
STMicroelectronics, Singapore, Singapore
Abstract :
Board level solder joint reliability during drop test is a great concern to semiconductor and electronic product manufacturers. In this paper, comprehensive dynamic responses of printed circuit boards (PCBs) and solder joints, e.g., acceleration, strains, and resistance, are measured and analyzed in detail with a multi-channel real-time electrical monitoring system. Control and monitoring of dynamic responses are very important to ensure consistent test results and understand the mechanical behaviors, as they are closely related to solder joint failure mechanisms. The effects of test variables, such as drop height, number of PCB mounting screws, tightness of screws, and number of felt layers, are studied by comparing and analyzing the dynamic responses.
Keywords :
circuit reliability; dynamic response; failure analysis; fast Fourier transforms; frequency-domain analysis; impact (mechanical); impact testing; modal analysis; printed circuit testing; PCB mounting screw number; PCB solder joints; acceleration; board level drop test; drop height; dynamic response; fast Fourier transform; felt layers; frequency domain analysis; mechanical shock; modal analysis; multichannel real-time electrical monitoring system; resistance; screw tightness; solder joint failure mechanisms; solder joint reliability; strain; Circuit testing; Condition monitoring; Electronic equipment testing; Fasteners; Modal analysis; Printed circuits; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing; Soldering;
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
DOI :
10.1109/EPTC.2003.1271522