DocumentCode :
2607524
Title :
MEMS vacuum packaging technology and applications
Author :
Jin, Y. ; Wang, Z.F. ; Lim, P.C. ; Pan, D.Y. ; Wei, J. ; Wong, J. Wei C K
Author_Institution :
Singapore Inst. of Manuf. Technol., Singapore
fYear :
2003
fDate :
10-12 Dec. 2003
Firstpage :
301
Lastpage :
306
Abstract :
Vacuum packaging is essential for various kinds of microelectromechanical system (MEMS) devices for enhancing the performance and reliability. This paper presents our works on research on vacuum packaging of MEMS devices. A hermetical sealing technique has been developed, which involves the processes of anodic bonding for silicon and glass wafers with imperfect interface, adhesive bonding, glass frit bonding and silicon-to-gold eutectic bonding. Vacuum maintenance has been achieved by applying evaporable and nonevaporable getter films in the packaging process. A specific helium leak detector with bombing system is introduced, which can monitor the deformation of micro diaphragms and conduct leak detection for MEMS structures.
Keywords :
electronics packaging; getters; hermetic seals; leak detection; micromechanical devices; wafer bonding; He; MEMS vacuum packaging technology; Si-Au; adhesive bonding; anodic bonding; eutectic bonding; evaporable getter films; glass frit bonding; helium bombing system; helium leak detector; hermetic sealing; leak detection; micro diaphragm deformation; microelectromechanical system devices; nonevaporable getter films; reliability; silicon/glass wafers; vacuum maintenance; Glass; Leak detection; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Packaging; Silicon; Vacuum systems; Vacuum technology; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
Type :
conf
DOI :
10.1109/EPTC.2003.1271534
Filename :
1271534
Link To Document :
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