Title :
Boundary condition independent dynamic compact models of packages and heat sinks from thermal transient measurements
Author :
Rencz, M. ; Farkas, G. ; Székely, V. ; Poppe, A. ; Courtois, B.
Author_Institution :
MicReD, Budapest, Hungary
Abstract :
In this paper a methodology developed for the generation of transient compact models of packages and heat sinks from measured thermal transient results is described. The main advantage of generating dynamic compact models solely from measured results is the time-gain: the lengthy transient simulations, suggested by the DELPHI methodology can be omitted. After summarizing the procedure of generating the compact models of packages and heat sinks from measurements the use of the obtained dynamic compact package models in board level simulators, extended with the feature of calculating with compact models is presented.
Keywords :
curve fitting; electronic engineering computing; heat sinks; heat transfer; semiconductor device packaging; semiconductor process modelling; thermal management (packaging); transient response; DELPHI methodology; DOTCOMP program; bipolar power transistor; board level simulators; boundary condition independent models; cumulative structure functions; dynamic compact models; heat sinks; heat transfer coefficient; packages; thermal transient measurements; transient compact models; transient curves; Boundary conditions; Capacitance; Circuit simulation; Computational fluid dynamics; Heat sinks; Length measurement; Optimization methods; Packaging; Printed circuits; Steady-state;
Conference_Titel :
Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
Print_ISBN :
0-7803-8205-6
DOI :
10.1109/EPTC.2003.1271568