DocumentCode :
2608500
Title :
Aging Characters Analysis of Composite Insulators
Author :
Bo, He ; Jun, CWan ; Haiyun, Jin ; Naikui, Gao ; Zongren, CPeng
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an JiaoTong Univ., Xianning
fYear :
2008
fDate :
9-12 Nov. 2008
Firstpage :
415
Lastpage :
419
Abstract :
In this paper, a composite insulator with seven years running history at power grid was taken into account. At first, an electric field was computed through finite elements method and electric field difference at different shed was compared. Secondly, through SEM photos of silastic sections from different sheds, microcosmic structure character of silastic aging under electric and ultraviolet effect was analyzed; through contrasting microcosmic structure of side surface with top and bottom surface of shed, the rules of electric aging and electric erosion was studied; through energy spectrum analysis, the possibility of surface contamination moving into inner of silastic was studied. The results gotten from this paper are positive and helpful for advanced aging studying of composite insulator and optimization design of insulator for anti-aging.
Keywords :
ageing; composite insulators; finite element analysis; insulator contamination; insulator testing; power grids; scanning electron microscopy; silicone rubber insulators; spectral analysis; surface contamination; ultraviolet radiation effects; SEM photos; aging characters analysis; composite insulators; electric erosion; electric field difference; energy spectrum analysis; finite element method; insulator design; microcosmic structure; microcosmic structure character; power grid; silastic aging; surface contamination; ultraviolet effect; Aging; Dielectrics and electrical insulation; Electric potential; Finite element methods; History; Insulator testing; Numerical analysis; Power engineering and energy; Power grids; Surface contamination; SEM; Silastic; aging; power spectrum analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-3823-5
Electronic_ISBN :
978-1-4244-2810-6
Type :
conf
DOI :
10.1109/ICHVE.2008.4773961
Filename :
4773961
Link To Document :
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