Title :
On-chip tests for gain bandwidth product and slew rate
Author :
Ramamurthy, Karthikeyan ; Kenney, John G. ; Rangan, Giri
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
Simple and accurate time-domain vs. voltage-domain methods to measure the gain bandwidth product and the slew rate of an operational amplifier (op-amp) are presented. These test methods are implemented on a breadboard using an LM741 op-amp. Measurements using the proposed techniques closely matches measurements from established techniques. The simplicity of the test structures makes them suitable in the implementation of testable op-amps on integrated circuits
Keywords :
analogue integrated circuits; integrated circuit measurement; integrated circuit testing; operational amplifiers; time-domain analysis; LM741; gain bandwidth product; operational amplifier; slew rate; test structures; time-domain methods; voltage-domain methods; Analog circuits; Bandwidth; Circuit testing; Gain measurement; Integrated circuit measurements; Integrated circuit testing; Logic testing; Operational amplifiers; Output feedback; Voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.393979
