Design considerations in low level analog test systems

Author

Kirsop, Doug ; Yeager, John

Author_Institution

Keithley Instrum. Inc., Cleveland, OH, USA

fYear

1990

fDate

17-21 Sep 1990

Firstpage

577

Lastpage

582

Abstract

The integrity of low-level analog measurements in an automatic test system is comprised by many possible error sources. These errors can cause readings by even the most accurate instruments to be inaccurate. Many of these errors can be attributed to the signal switching. Methods and techniques used to minimizes or eliminate these errors are discussed. Low-current, high-resistance, and low-voltage measurements are examined, and a multiplex test system and a matrix test system are considered as system examples

Keywords

automatic test equipment; electric current measurement; electric resistance measurement; interference (signal); interference suppression; measurement errors; random noise; voltage measurement; automatic test; error sources; interference; leakage currents; low current measurement; low-level analog measurements; low-voltage measurements; matrix test system; multiplex test system; noise; shielding; signal switching; Automatic testing; Hardware; Instruments; Interference; Noise level; Switches; System testing; Thermal resistance; Voltage; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.

Conference_Location

San Antonio, TX

Type

conf

DOI

10.1109/AUTEST.1990.111564

Filename

111564