Title :
Reliability Testing and Evaluation of Magnetic Bubble Memories for Electronic Switching Systems
Author :
Yamaguchi, Nakahiko ; Hibi, Susumu
Author_Institution :
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Musashino-shi, 180 Japan
Abstract :
The reliability of magnetic bubble memories were investigated to determine their applicability in electronic switching systems (ESS). The results revealed that reliability sufficient for a 22-year ESS life-time should be expected. Based on these results, thousand ESS magnetic bubble memory units with 4.3 Mbit capacity wEre produced and operated without any problems.
Keywords :
Assembly; Conductors; Electronic equipment testing; Electronic switching systems; Garnet films; Magnetic fields; Magnetic sensors; Magnetic separation; Solid state circuits; System testing;
Conference_Titel :
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1980.362917
