Title :
On multiple fault detection of parity checkers
Author :
Wu, Cheng-Juei ; Jone, Wen-Ben
Author_Institution :
Dept. of Comput. Sci., New Mexico Technol., Socorro, NM, USA
Abstract :
The multiple fault detection of parity checkers is investigated. It is found that any multiple stuck-at fault occurring on a parity checker can be completely detected using test patterns provided by the identity matrix plus zero vector. The identity matrix can also detect all multiple general bridging faults, if the bridgings result in a wired-AND effect. Test patterns generated from the identity matrix and binary matrix are required to detect the multiple bridging faults which yield a wired-OR connection
Keywords :
automatic testing; fault diagnosis; fault location; integrated circuit testing; logic testing; binary matrix; bridging faults; identity matrix; multiple fault detection; multiple stuck-at fault; parity checkers; test patterns; wired-AND effect; wired-OR connection; zero vector; Circuit faults; Circuit testing; Computer errors; Computer science; Digital systems; Electrical fault detection; Fault detection; Feedback; Reliability engineering; Test pattern generators;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.394023
