Title :
High-speed short cavity strained-layer multiple quantum well lasers
Author :
Lester, L.F. ; Schaff, W.J. ; Song, X. ; Offsey, S.D. ; Eastman, L.F.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
The high-speed response and optical properties of strained-layer In0.3Ga0.7As four and five quantum-well ridge waveguide lasers fabricated by chemically-assisted ion beam etching (CAIBE) are presented. The threshold current variation with cavity length is very similar for the two-layer designs, but the differential gain decreases more quickly with optical loss in the four quantum-well devices. Consequently, whereas the 200-400 μm cavity length lasers from the four quantum-well wafer are superior to those from the five quantum-well layer in terms of high speed performance, the 50- and 100-μm long devices are nearly identical. A CW 3-dB bandwidth of 22 GHz and a record 3-dB bandwidth of 26 GHz under pulsed bias have been measured on 50μm long lasers. 100-μm cavity length lasers exhibit excellent modulation efficiency with a typical 3-dB bandwidth of 20 GHz
Keywords :
laser cavity resonators; optical losses; optical modulation; optical waveguides; semiconductor junction lasers; 20 GHz; 22 GHz; 26 GHz; 50 to 400 micron; CAIBE; CW 3-dB bandwidth; In0.3Ga0.7As; MQW lasers; cavity length; chemically-assisted ion beam etching; differential gain; high-speed response; modulation efficiency; multiple quantum well lasers; optical loss; optical properties; pulsed bias; ridge waveguide lasers; semiconductor lasers; short cavity; strained-layer; threshold current variation; Bandwidth; Chemical lasers; High speed optical techniques; Ion beams; Optical waveguides; Particle beam optics; Pulse measurements; Pulse modulation; Quantum well lasers; Waveguide lasers;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1991., Proceedings IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-0491-8
DOI :
10.1109/CORNEL.1991.169990