Title :
Head-Disk Interface Design For In-Contact Recording Using Wet Systems
Author :
Sate, A. ; Ajiki, K. ; Yanagisawa, M.
Author_Institution :
Functional Devices Research Laboratories, NEC Corporation
Keywords :
Atomic force microscopy; Atomic measurements; Disk recording; Drag; Dry etching; Force measurement; Glass; Lubricants; National electric code; Testing;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597421
