DocumentCode :
2612213
Title :
Parametric Modeling of the Cross-Correlation for Large-Scale-Fading of Propagation Channels
Author :
Yin, Xuefeng ; Zhou, Xu ; Zhang, Zhifeng ; Kim, Myung-Don ; Chung, Hyun Kyu
Author_Institution :
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear :
2012
fDate :
6-9 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
Accurate models of the cross-correlation of the large-scale-fading in different propagation channels is essential for designing wireless systems using distributed transmission topologies, such as the coordinated multi-point (CoMP) transmission system. In this contribution, a new parameter defined as the normalized power of common paths in two propagation channels is applied to modeling the cross-correlation of the large-scale-fading in different channels. The common paths here are referred to as the paths with identical parameters, i.e. the delays, Doppler frequencies, directions of arrival and directions of departure. Under the uncorrelated scattering (US) assumption, a new geometrical approach is proposed for modeling the large-scale-fading cross-correlation. Experimental investigations show that the proposed modeling method can be used to generate channel cross-correlation coefficients consistent with the experimental results to a certain extent. We postulate that the discrepancies observed between the empirical and theoretical results are caused by the unrealistic US assumption.
Keywords :
correlation methods; direction-of-arrival estimation; fading channels; telecommunication network topology; Doppler frequencies; coordinated multi-point transmission system; cross-correlation; directions of arrival; directions of departure; distributed transmission topologies; large-scale-fading; parametric modeling; propagation channels; uncorrelated scattering assumption; wireless systems; Antenna measurements; Antenna radiation patterns; Channel models; Correlation; Fading; Indexes; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
Conference_Location :
Yokohama
ISSN :
1550-2252
Print_ISBN :
978-1-4673-0989-9
Electronic_ISBN :
1550-2252
Type :
conf
DOI :
10.1109/VETECS.2012.6240115
Filename :
6240115
Link To Document :
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