DocumentCode
26124
Title
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines
Author
Henard, Christopher ; Papadakis, Mike ; Perrouin, Gilles ; Klein, John ; Heymans, Patrick ; Le Traon, Yves
Author_Institution
Interdiscipl. Centre for Security, Reliability & Trust, Univ. of Luxembourg, Luxembourg, Luxembourg
Volume
40
Issue
7
fYear
2014
fDate
July 1 2014
Firstpage
650
Lastpage
670
Abstract
Large Software Product Lines (SPLs) are common in industry, thus introducing the need of practical solutions to test them. To this end, t-wise can help to drastically reduce the number of product configurations to test. Current t-wise approaches for SPLs are restricted to small values of t. In addition, these techniques fail at providing means to finely control the configuration process. In view of this, means for automatically generating and prioritizing product configurations for large SPLs are required. This paper proposes (a) a search-based approach capable of generating product configurations for large SPLs, forming a scalable and flexible alternative to current techniques and (b) prioritization algorithms for any set of product configurations. Both these techniques employ a similarity heuristic. The ability of the proposed techniques is assessed in an empirical study through a comparison with state of the art tools. The comparison focuses on both the product configuration generation and the prioritization aspects. The results demonstrate that existing t-wise tools and prioritization techniques fail to handle large SPLs. On the contrary, the proposed techniques are both effective and scalable. Additionally, the experiments show that the similarity heuristic can be used as a viable alternative to t-wise.
Keywords
combinatorial mathematics; program testing; software product lines; SPL; combinatorial explosion; configuration process; product configuration generation; product configurations; search based approach; similarity heuristic; software product lines; test configurations; Arrays; Context; Frequency modulation; Linux; Scalability; Software; Testing; Software product lines; T-wise Interactions; prioritization; search-based approaches; similarity; testing;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.2014.2327020
Filename
6823132
Link To Document