DocumentCode :
2612633
Title :
Unique Observations on Moisture Analysis: "Consumer" and Analyst
Author :
Lowry, R.K.
Author_Institution :
Harris Semiconductor, P. 0. Box 883, M/S PT-40, Melbourne, FL 32901-0101
fYear :
1983
fDate :
30407
Firstpage :
270
Lastpage :
273
Keywords :
Failure analysis; Glass; Hydrogen; Integrated circuit packaging; Laboratories; Mass spectroscopy; Moisture; Round robin; Semiconductor device reliability; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location :
Phoenix, AZ, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1983.361995
Filename :
4208516
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2612633
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