DocumentCode :
2614939
Title :
Measurement of ambipolar mobility-lifetime product and its significance for amorphous silicon cells
Author :
Sauvain, E. ; Shah, A. ; Hubin, J.
Author_Institution :
Inst. de Microtech., Neuchatel Univ., Switzerland
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
1560
Abstract :
In order to evaluate correctly the ambipolar diffusion length (Lamb) or the ambipolar drift length (Le) from a steady-state photocarrier grating (SSPG) diffusion or drift measurement, the condition of charge quasi-neutrality has to be maintained everywhere in the material (ambipolarity condition). This is shown theoretically by calculating the experimentally accessible parameter (β) without assuming that the ambipolarity condition holds. The effect of nonambipolar behavior on the experimental plots, both for diffusion and for drift, is derived. Measured SSPG plots for undoped a-Si:H are given, illustrating both ambipolar and nonambipolar cases
Keywords :
amorphous semiconductors; carrier lifetime; carrier mobility; elemental semiconductors; hydrogen; silicon; solar cells; ambipolar mobility-lifetime product; amorphous Si:H solar cells; charge quasi-neutrality; diffusion length; drift length; Amorphous silicon; Charge carrier processes; Electric variables measurement; Electron mobility; Electron traps; Gratings; Length measurement; Magnetic field measurement; Photovoltaic cells; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
Type :
conf
DOI :
10.1109/PVSC.1990.111870
Filename :
111870
Link To Document :
بازگشت