DocumentCode :
2615450
Title :
Limits on voltage scaling for caches utilizing fault tolerant techniques
Author :
Makhzan, Mohammad A. ; Khajeh, Amin ; Eltawil, Ahmed ; Kurdahi, Fadi
Author_Institution :
Univ. of California Irvine, Irvine, CA
fYear :
2007
fDate :
7-10 Oct. 2007
Firstpage :
488
Lastpage :
495
Abstract :
This paper proposes a new low power cache architecture that utilizes fault tolerance to allow aggressively reduced voltage levels. The fault tolerant overhead circuits consume little energy, but enable the system to operate correctly and boost the system performance to close to defect free operation. Overall, power savings of over 40% are reported on standard benchmarks.
Keywords :
cache storage; fault tolerance; cache architecture; fault tolerant overhead circuits; fault tolerant techniques; voltage scaling; Circuit faults; Decoding; Energy consumption; Error correction codes; Fault tolerance; Fault tolerant systems; Hardware; Manufacturing; System performance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2007. ICCD 2007. 25th International Conference on
Conference_Location :
Lake Tahoe, CA
ISSN :
1063-6404
Print_ISBN :
978-1-4244-1257-0
Electronic_ISBN :
1063-6404
Type :
conf
DOI :
10.1109/ICCD.2007.4601943
Filename :
4601943
Link To Document :
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