Title :
Random correction using singles count rates for DOI Positron Emission Mammography
Author :
Yamakawa, Yoshiyuki ; Kitamura, Keishi ; Yamada, Yosihiro ; Hashizume, Nobuya ; Kawashima, Ayako ; Kumazawa, Yoshihiko
Author_Institution :
Technology Research Laboratory, Shimadzu Corporation, 619-0237 Kyoto Japan
Abstract :
With the aim of realizing the early diagnosis of breast cancer, we are promoting the research and development of a high-resolution Positron Emission Mammography (PEM). In order to obtain both high resolution and high sensitivity, this scanner uses for-layer DOI (depth of interaction) detectors consisting of small crystals being positioned close to the breast Since the total number of crystals in the scanner is extremely large and it is predicted that the total number of LORs is greater than the total number of events, a list-mode iterative image reconstruction method is required. Furthermore, a random correction method based on singles counting is beneficial for reducing statistical noise in randoms estimation at each LOR. However, an extremely large number of counters are required to count single events for each crystal. We also developed a random correction method calculating the count for each crystal. This method makes it possible to reduce the number of counters. We evaluated the efficacy of this technique incorporated in a list-mode iterative reconstruction using simulation data. Results demonstrated that random correction using conventional delayed coincidence method does not work well for the list-mode iterative reconstruction having an extremely large number of LORs, whereas random correction using singles count rates is effective for improving the image quality.
Keywords :
Breast cancer; Counting circuits; Crystals; Event detection; Image reconstruction; Image resolution; Iterative methods; Mammography; Radioactive decay; Research and development;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2008.4774391