DocumentCode
26178
Title
Single-Flange 2-Port TRL Calibration for Accurate THz 
-Parameter Measurements of Waveguide Integrated Circuits
Author
Hanning, Johanna ; Stenarson, J. ; Yhland, K. ; Sobis, Peter J. ; Bryllert, Tomas ; Stake, Jan
Author_Institution
Dept. of Microtechnol. & Nanosci.-MC2, Chalmers Univ. of Technol., Göteborg, Sweden
Volume
4
Issue
5
fYear
2014
fDate
Sept. 2014
Firstpage
582
Lastpage
587
Abstract
This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220-325 GHz).
Keywords
S-parameters; calibration; measurement uncertainty; microwave integrated circuits; network analysers; substrate integrated waveguides; S-parameter characterization; TRL calibration kit; VNA drift; VNA extender cable movement; WR-03; frequency 220 GHz to 325 GHz; measurement uncertainty; single flange 2-port measurement setup; vector network analyzer extender cable movement; waveguide integrated circuits; waveguide manufacturing tolerances; Calibration; Educational institutions; Microwave circuits; Standards; Uncertainty; ${rm S}$
fLanguage
English
Journal_Title
Terahertz Science and Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-342X
Type
jour
DOI
10.1109/TTHZ.2014.2342497
Filename
6877746
Link To Document