Title :
Multi-dimensional robust edge detection
Author :
Liu, Linnan ; Schunck, Brian G. ; Meyer, Charles R.
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Abstract :
A multidimensional edge model is established and a first-order estimation for multidimensional edge profiles is proposed. An optimal edge location detection algorithm is developed. The advantages of the algorithm are that (1) it has little dependence on assumptions of edge models, noise models, or smoothing filters, (2) it has better abilities for detecting very weak edges and making less edge orientation errors than other edge detectors, (3) it can handle corners and complicated multidimensional image structures, and (4) it detects different edge types at the same time
Keywords :
pattern recognition; picture processing; corners; edge location detection algorithm; image structures; multidimensional edge model; multidimensional edge profiles; Artificial intelligence; Detection algorithms; Detectors; Filtering theory; Image edge detection; Laboratories; Noise measurement; Robustness; Smoothing methods; Voting;
Conference_Titel :
Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-8186-2148-6
DOI :
10.1109/CVPR.1991.139787
