DocumentCode :
2620745
Title :
Piezoelectric ceramic disks with thickness-graded material properties
Author :
Lee, P.C.Y. ; Yu, J.D. ; Li, X. ; Shih, W.-H.
Author_Institution :
Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
fYear :
1997
fDate :
28-30 May 1997
Firstpage :
769
Lastpage :
777
Abstract :
A system of two-dimensional first-order equations for electroded piezoelectric crystal plates with general symmetry and thickness-graded material properties was recently deduced from the three-dimensional equations of linear piezoelectricity. These equations are much simplified for the two limiting cases of thickness-graded piezoelectric properties, i.e., the homogeneous plate and bimorph of piezoelectric ceramics. Closed form solutions are obtained from these reduced equations for the flexural and thickness-shear vibrations and static response of bimorph disks as well as for the extensional and thickness-stretch vibrations of homogeneous disks. Frequency spectra and modes are computed and examined. Resonance frequencies for both homogeneous and bimorph disks of PZT-857 are computed and measured. The comparison of the results shows that the agreement is close
Keywords :
crystal resonators; lead compounds; piezoceramics; piezoelectric transducers; PZT; PZT-857; PbZrO3TiO3; bimorph disks; closed form solutions; electroded piezoelectric crystal plates; extensional vibrations; homogeneous disks; homogeneous plate; linear piezoelectricity; piezoelectric ceramic disks; thickness-graded material properties; thickness-stretch vibrations; two-dimensional first-order equations; Ceramics; Closed-form solution; Crystalline materials; Equations; Frequency measurement; Material properties; Piezoelectric materials; Piezoelectricity; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3728-X
Type :
conf
DOI :
10.1109/FREQ.1997.638791
Filename :
638791
Link To Document :
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