Title :
7.5 A 0.3mm-resolution Time-of-Flight CMOS range imager with column-gating clock-skew calibration
Author :
Yasutomi, Keita ; Usui, Takahiro ; Sang-Man Han ; Takasawa, Taishi ; Kagawa, Keiichiro ; Kawahito, S.
Author_Institution :
Shizuoka Univ., Hamamatsu, Japan
Abstract :
Recently, 3D scanning systems have attracted rapidly rising attention in combination with 3D printers. One of the common technologies in contactless 3D scanners is the light-section method, which has advantages in term of accuracy. The method, however, requires a long base line between a camera and light source to achieve high resolution and a mechanical scanning system. A high range resolution Time-of-Flight (ToF) imager provides new possibilities of implementing a miniature head, which allows flexible scanning of an object with a complicated structure. The range resolution of reported CMOS ToF imagers [1-3] is limited to a few centimeters. For higher resolution, higher modulation frequency is required. However, the modulation frequency used for CMOS ToF imagers is limited to several tens of MHz. This paper presents a ToF imager with 0.3mm range resolution, which corresponds to 2ps time resolution. To achieve this high resolution, the imager uses a ToF measurement technique based on an impulse photocurrent response [4] and draining-only modulation (DOM) pixels [5]. To realize a range imager with 2D pixel array, column-wise gating-clock skew calibration is implemented to demonstrate simultaneous sub-mm ToF measurements for the whole pixel array.
Keywords :
CMOS image sensors; calibration; cameras; optical scanners; 2D pixel array; 3D printers; 3D scanning systems; CMOS ToF imagers; DOM pixels; ToF measurement technique; camera; column-gating clock-skew calibration; contactless 3D scanners; draining-only modulation pixel; flexible object scanning; high range resolution time-of-flight imager; impulse photocurrent response; light source; light-section method; mechanical scanning system; miniature head; modulation frequency; pixel array; simultaneous sub-mm ToF measurements; time 2 ps; time-of-flight CMOS range imager; Calibration; Clocks; Detectors; Image resolution; Image sensors; Modulation; Photoconductivity;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757369