DocumentCode
262118
Title
7.5 A 0.3mm-resolution Time-of-Flight CMOS range imager with column-gating clock-skew calibration
Author
Yasutomi, Keita ; Usui, Takahiro ; Sang-Man Han ; Takasawa, Taishi ; Kagawa, Keiichiro ; Kawahito, S.
Author_Institution
Shizuoka Univ., Hamamatsu, Japan
fYear
2014
fDate
9-13 Feb. 2014
Firstpage
132
Lastpage
133
Abstract
Recently, 3D scanning systems have attracted rapidly rising attention in combination with 3D printers. One of the common technologies in contactless 3D scanners is the light-section method, which has advantages in term of accuracy. The method, however, requires a long base line between a camera and light source to achieve high resolution and a mechanical scanning system. A high range resolution Time-of-Flight (ToF) imager provides new possibilities of implementing a miniature head, which allows flexible scanning of an object with a complicated structure. The range resolution of reported CMOS ToF imagers [1-3] is limited to a few centimeters. For higher resolution, higher modulation frequency is required. However, the modulation frequency used for CMOS ToF imagers is limited to several tens of MHz. This paper presents a ToF imager with 0.3mm range resolution, which corresponds to 2ps time resolution. To achieve this high resolution, the imager uses a ToF measurement technique based on an impulse photocurrent response [4] and draining-only modulation (DOM) pixels [5]. To realize a range imager with 2D pixel array, column-wise gating-clock skew calibration is implemented to demonstrate simultaneous sub-mm ToF measurements for the whole pixel array.
Keywords
CMOS image sensors; calibration; cameras; optical scanners; 2D pixel array; 3D printers; 3D scanning systems; CMOS ToF imagers; DOM pixels; ToF measurement technique; camera; column-gating clock-skew calibration; contactless 3D scanners; draining-only modulation pixel; flexible object scanning; high range resolution time-of-flight imager; impulse photocurrent response; light source; light-section method; mechanical scanning system; miniature head; modulation frequency; pixel array; simultaneous sub-mm ToF measurements; time 2 ps; time-of-flight CMOS range imager; Calibration; Clocks; Detectors; Image resolution; Image sensors; Modulation; Photoconductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4799-0918-6
Type
conf
DOI
10.1109/ISSCC.2014.6757369
Filename
6757369
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