DocumentCode :
2622482
Title :
Development of APD measuring equipment and its faculty
Author :
Uchino, Masaharu ; Shinozuka, Takashi ; Sat, Risaburo
Author_Institution :
ElectroMagnetic Compatibility Res. Labs. Co. Ltd., Yoshinari, Japan
Volume :
2
fYear :
1998
fDate :
24-28 Aug 1998
Firstpage :
739
Abstract :
Amplitude probability distribution (APD) measuring equipment has been developed that can measure amplitude distribution semi-continuously. Two sets of this equipment at resolution bandwidths of 100 MHz and 1 MHz were used to make simultaneous APD measurements of electromagnetic disturbance leaking from a microwave oven. On comparing the results of both measurements, it was found that measurements made at a resolution bandwidth of 100 MHz were superior in terms of repeatability. In addition, simultaneous measurements were performed by the weighting method proposed by CISPR (at a video bandwidth of 10 Hz) and by APD measurements at a video bandwidth of 3 MHz. Based on the average value obtained from the latter measurements, a method is proposed to evaluate such leaking disturbance, and this method is compared with the results of the former measurements
Keywords :
electric field measurement; electromagnetic interference; magnetic field measurement; microwave heating; ovens; probability; test equipment; CISPR; ProdeF; amplitude distribution measurement; amplitude probability distribution; electromagnetic disturbance leak; envelope sampling method; leaking EM disturbance; microwave oven; resolution bandwidth; resolution bandwidths; video bandwidth; weighting method; Bandwidth; Bit error rate; Digital communication; Electromagnetic measurements; Frequency; Integrated circuit measurements; Interference; Performance evaluation; Quadratic programming; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
Type :
conf
DOI :
10.1109/ISEMC.1998.750291
Filename :
750291
Link To Document :
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