Title :
14.8 A 247-to-263.5GHz VCO with 2.6mW peak output power and 1.14% DC-to-RF efficiency in 65nm Bulk CMOS
Author :
Adnan, Muhammad ; Afshari, Ehsan
Author_Institution :
Cornell Univ., Ithaca, NY, USA
Abstract :
Signal generation at mm-Wave-to-THz frequencies is attractive because of its applications in bio-sensing, spectroscopy, detection of concealed weapons, as well as high-data-rate communication. CMOS is considered a potential platform to implement a low-cost and high-yield signal generation solution at this frequency range. Despite continuous scaling, effective fmax of active devices is not high enough and hence either harmonic oscillators or frequency multipliers are employed for high-frequency signal generation. In recent CMOS VCO designs, reasonable power levels (~1mW) and tuning range (~10GHz) have been reported at around 300GHz but with very low DC-to-RF efficiency (<;0.4%), which is undesirable for portable applications [1,4]. Moreover, power-level fluctuation is more than 3dB across the frequency range [1]. In this work, we introduce a scalable VCO architecture that efficiently generates and extracts the 2nd harmonic at 256GHz and hence simultaneously achieves high tuning range (16GHz), high output power (2.6mW), high DC-RF efficiency (1.14%), and low phase noise (-94dBc/Hz to -85dBc/Hz at 1MHz offset frequency across the tuning range). When compared to published state-of-the-art, this work demonstrates the highest output power, tuning range, and DC-to-RF efficiency, and the lowest phase noise among all CMOS VCOs above 200GHz.
Keywords :
CMOS integrated circuits; circuit tuning; field effect MIMIC; millimetre wave oscillators; voltage-controlled oscillators; 2nd harmonic; CMOS VCO; DC-RF efficiency; bulk CMOS; efficiency 1.14 percent; frequency 247 GHz to 263.5 GHz; high tuning range; low phase noise; peak output power; power 2.6 mW; scalable VCO architecture; size 65 nm; Harmonic analysis; Logic gates; Power generation; Transistors; Tuning; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757427