DocumentCode :
2623578
Title :
A compact nonlinear model for coplanar waveguides on silicon substrates
Author :
Sun, Zhuowen ; Fay, P.
Author_Institution :
Dept. of Electr. Eng., Notre Dame Univ., IN, USA
fYear :
2004
fDate :
8-10 Sept. 2004
Firstpage :
191
Lastpage :
194
Abstract :
A wideband nonlinear equivalent circuit model for quasi-TEM coplanar waveguide (CPW) transmission lines fabricated on low-resistivity Si substrates is proposed and verified experimentally. The model includes nonlinear bias-dependent junction conductances and capacitances, which enable the model to scale with substrate doping concentration and transmission line geometry. Numerical calculation of the CPW capacitance, based on 2D solutions of Poisson´s equation, as well as experimental investigations of the dependence of model parameters on substrate doping type (both n- and p-type) and doping concentration have been performed. Measurements of typical devices show excellent agreement between the model prediction and measured transmission line S-parameters from 100 MHz to 10 GHz. Analysis of the model indicates that a full back-to-back metal-semiconductor junction contact model is required for CPWs on n-type substrates, while the higher Schottky barrier height of typical metal contacts to p-type Si permits a simpler one-sided junction model for CPWs on p-type substrates.
Keywords :
Poisson equation; S-parameters; capacitance; coplanar waveguides; electric admittance; equivalent circuits; integrated circuit modelling; nonlinear network analysis; semiconductor device models; semiconductor doping; silicon; substrates; 100 MHz to 10 GHz; CPW capacitance; Poisson equation; Schottky barrier height; Si; back-to-back metal-semiconductor junction contact model; bias-dependent junction conductances; doping concentration; n-type substrates; nonlinear junction conductances; nonlinear model; one-sided junction model; p-type substrates; quasi-TEM CPW; quasi-TEM coplanar waveguides; silicon substrates; substrate doping concentration; transmission line S-parameters; transmission line geometry; wideband equivalent circuit model; Capacitance; Coplanar transmission lines; Coplanar waveguides; Distributed parameter circuits; Doping; Semiconductor process modeling; Silicon; Solid modeling; Transmission line measurements; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2004. Digest of Papers. 2004 Topical Meeting on
Print_ISBN :
0-7803-8703-1
Type :
conf
DOI :
10.1109/SMIC.2004.1398200
Filename :
1398200
Link To Document :
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