Title :
EP2: Anatomy of innovation: Bug or feature?
Author :
Lee, Harry ; Nishimura, Ken ; Lee, Harry
Author_Institution :
MIT, Cambridge, MA
Abstract :
As process scaling slows down, circuit innovation is becoming one of the most important differentiators. We can point to great inventions of the past that were accidental, or failed attempts to solve other problems (bugs), as well as those from logical thinking (features). Which is more effective? In this panel, top analog circuit innovators describe the process by which their best innovations were conceived. They give interesting examples, such as turning a bug in the circuit into a feature. Then they argue whether innovation is more effective as a result of accidental discovery or logical thinking.
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757534