DocumentCode :
262587
Title :
EP2: Anatomy of innovation: Bug or feature?
Author :
Lee, Harry ; Nishimura, Ken ; Lee, Harry
Author_Institution :
MIT, Cambridge, MA
fYear :
2014
fDate :
9-13 Feb. 2014
Firstpage :
526
Lastpage :
526
Abstract :
As process scaling slows down, circuit innovation is becoming one of the most important differentiators. We can point to great inventions of the past that were accidental, or failed attempts to solve other problems (bugs), as well as those from logical thinking (features). Which is more effective? In this panel, top analog circuit innovators describe the process by which their best innovations were conceived. They give interesting examples, such as turning a bug in the circuit into a feature. Then they argue whether innovation is more effective as a result of accidental discovery or logical thinking.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0193-6530
Print_ISBN :
978-1-4799-0918-6
Type :
conf
DOI :
10.1109/ISSCC.2014.6757534
Filename :
6757534
Link To Document :
بازگشت