ITC 2014 Paper Awards [2 awards]

As part of the process of encouraging and appreciating the quality of written and presented work in the technical program, ITC presents awards to authors of regular technical papers given at the conference and published in the proceedings. In the process of determining the award winning papers, the ITC awards committee considers reviews and comments from several sources including: responses by conference attendees as recorded on the session ratings cards; and observations and recommendations from select ITC program committee members. For the 2013 ITC Ned Kornfield Best Paper Award, the awards committee has chosen: "Test Time Reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations" by D. Chen and Z. Yu (both of Iowa State University) and K. Maniar and M. Nowrozi (both of Texas Instruments). For the 2004 ITC Most Significant Paper Award, the award committee has selected the following paper published at ITC 2004: "Scan-based Side-Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard" by B. Yang, K. Wu, and R. Karri, (all of Polytechnic University).