Nanosecond Measurement of Microwave Reflection Coefficients and Properties of Materials

This paper presents a technique of measuring the change in the microwave reflection coefficient and Hall rotation angle while an exploslve-generated, high-pressure shock wave propagates through a dielectric or semiconductor material in a magnetic field. With this technique, the permittivity, conductivity, and Hall coefficient can be calculated. The technique is widely applicable to measurement of fast changes (10 nanoseconds) in microwave properties; furthermore, the principles are adaptable to lower and higher frequency measurements.