• DocumentCode
    262835
  • Title

    Board security enhancement using new locking SIB-based architectures

  • Author

    Dworak, Jennifer ; Conroy, Zoe ; Crouch, Al ; Potter, John

  • Author_Institution
    Southern Methodist Univ., Dallas, TX, USA
  • fYear
    2014
  • fDate
    20-23 Oct. 2014
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Circuit boards are especially vulnerable to security attacks. Many routes and pins can be probed directly. Other pins may be controlled and observed through the JTAG boundary scan port. The JTAG port may also provide access to each chip´s internal scan chains. Furthermore, modern chips may include embedded instruments that can be accessed through the chip´s JTAG port and an internal IEEE P1687 scan network. If accessed by an attacker, these instruments may allow data to be leaked from the chips themselves or allow the attacker to drive other chips on the board. Finally, FPGA firmware is often stored in on-board memories and must be protected to prevent IP theft. In this paper, we describe some of the security issues facing boards. We then describe new chip access protocols that harness the use of licensed software and locking segment insertion bits (LSIBs) for secure Chip ID extraction. These methods enable authorized access while helping to prevent unauthorized access and counterfeiting of chips and IP on the board.
  • Keywords
    boundary scan testing; embedded systems; field programmable gate arrays; printed circuit testing; FPGA firmware; IP theft; JTAG boundary scan port; board security enhancement; chip access protocols; circuit boards; embedded instruments; internal IEEE P1687 scan network; internal scan chains; licensed software; locking SIB-based architectures; locking segment insertion bits; on-board memories; secure chip ID extraction; security attacks; unauthorized access; Cryptography; Instruments; Microprogramming; Ports (Computers); Registers; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2014 IEEE International
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/TEST.2014.7035355
  • Filename
    7035355