• DocumentCode
    2628958
  • Title

    Possibilities and limits of controlling 3D electrostatic field distributions with insulator surfaces

  • Author

    González-Filgueira, Gerardo ; Gomollon, Jesús A. ; Santomé, Emiilio

  • Author_Institution
    Area de Ingenieria Electr., A CorunaUniv. de A. Coruna, Ferrol, Spain
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    486
  • Abstract
    Through optimization techniques it is possible to affect the field distribution of a given high voltage arrangement by modifying the shape of electrodes and insulators. When the modification of the shape of insulators is used to control the values of the total field strength intensity on their surfaces, the reduction in the field values that can be achieved is nor the same for every high voltage arrangement. In this paper, the theoretical and practical limits of such techniques are investigated. An axially symmetrical configuration that has been repeatedly used for optimization tasks has been extended adding a grounded electrode to obtain a 3D-Field. The surface of an insulator has been modified by taking as objective the reduction of the maximum total field strength intensity on its surface. The position of the grounded electrode and the way in which the insulator surface is modified are varied to study the influence of different parameters in the resulting field distribution. The possibility of fixing or freeing the end-points of the insulator is also studied
  • Keywords
    electric fields; 3D electrostatic field distribution; ground electrode; high voltage structure; insulator surface; optimization; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Electrostatics; Filling; Insulator testing; Laplace equations; Shape control; Smoothing methods; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    0-7803-6413-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.2000.884004
  • Filename
    884004