Title :
Robust Design-for-Productization Practices for High Quality Automotive Products
Author :
Bernardi, Paolo ; Melchiori, Fabio ; Pandini, Davide ; Pugliese, Santo ; Appello, Davide
Author_Institution :
Politecnico 2di Torino, Dipartimento di Automatica ed Infontnatica, Italy
Abstract :
This paper discusses the fabrication challenges introduced by products targeted to the automotive market segment. Different methods to enhance intrinsic design robustness, along with the design flow will be discussed. Experimental results from simulations and daftafom the field will be presented to support the proposed solutions.
Keywords :
Automotive engineering; Circuit testing; Design for manufacture; Electromagnetic compatibility; Guidelines; Manufacturing; Production; Radiation effects; Robustness; Timing; DFM, on-chip variations, EMC, EMI, radiation effects;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.5483612
