DocumentCode :
2629302
Title :
Dielectric and mechanical behavior of cross-linked polyethylene under thermal aging
Author :
Mecheri, Y. ; Boukezzi, L. ; Boubakeur, A. ; Lallouani, M.
Author_Institution :
Dept. d´´Electrotech., Univ. de Tizi-Ouzou, Algeria
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
560
Abstract :
This paper deals with the influence of continuous thermal aging on the dielectric and mechanical properties of Cross-Linked Polyethylene (XLPE) used as electrical insulation in high voltage cables manufactured by ENICAB (Algeria). In order to characterize the degree of the material degradation under thermal aging and to prevent its failure, continuous accelerated thermal aging tests during 5000 hours on dumb-bells and circular shaped probes of Cross-Linked Polyethylene XLPE UNION CARBIDE 4201 were performed at four levels of temperature ranging from 80°C to 140°C. Some results showing the changes in dielectric losses factor, dielectric constant, resistivity, elongation at fracture and tensile strength with respect to the aging time at the different used aging temperatures are presented. The obtained results show that the thermal aging affects considerably the properties of the material
Keywords :
XLPE insulation; ageing; dielectric losses; electrical resistivity; elongation; fracture; permittivity; tensile strength; 80 to 140 C; XLPE UNION CARBIDE 4201; accelerated testing; cross-linked polyethylene; dielectric constant; dielectric loss factor; dielectric properties; electrical insulation; electrical resistivity; elongation; fracture; high voltage cable; mechanical properties; tensile strength; thermal aging; Aging; Cable insulation; Dielectric losses; Dielectric materials; Dielectrics and electrical insulation; Mechanical cables; Mechanical factors; Polyethylene; Pulp manufacturing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-6413-9
Type :
conf
DOI :
10.1109/CEIDP.2000.884022
Filename :
884022
Link To Document :
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