DocumentCode :
2630065
Title :
Measurement of the noise in a linear two-port device
Author :
Deschamps, G.A. ; Ore, F.R. ; Sweeney, J.J.
fYear :
1970
fDate :
11-14 May 1970
Firstpage :
179
Lastpage :
182
Abstract :
It is well known that the noise factor of a linear two-port depends on the impedance (or reflectance) of the source connected to it. This is easily understood if the noise sources inside the device are replaced by equivalent amplitude sources, one at each port. These sources produce outward traveling waves which are, in general, partially correlated. Thus if the wave at port 1 is reflected by the source mismatch it will interfere with the wave at 2 in a manner that depends on the source reflectance W.
Keywords :
Covariance matrix; Equations; Gaussian noise; Impedance; Noise level; Noise measurement; Reflectivity; Stokes parameters; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, G-MTT 1970 International
Conference_Location :
Newport Beach, CA, USA
Type :
conf
DOI :
10.1109/GMTT.1970.1122801
Filename :
1122801
Link To Document :
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