DocumentCode
2632287
Title
Computational complexity in logic testing
Author
Sziray, József
Author_Institution
Dept. of Inf., Szechenyi Univ., Gyo, Hungary
fYear
2010
fDate
5-7 May 2010
Firstpage
97
Lastpage
102
Abstract
The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.
Keywords
combinational circuits; computational complexity; digital circuits; fault diagnosis; logic testing; D-algorithm; NP-complete problems; combinational logic networks; composite justification; computational complexity; digital circuits; exponential time; fault detection tests; logic testing; stuck-at logic faults; test calculation problem; Algorithm design and analysis; Circuit faults; Circuit testing; Computational complexity; Digital circuits; Informatics; Logic testing; NP-complete problem; Polynomials; Turing machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Engineering Systems (INES), 2010 14th International Conference on
Conference_Location
Las Palmas
Print_ISBN
978-1-4244-7650-3
Type
conf
DOI
10.1109/INES.2010.5483865
Filename
5483865
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