• DocumentCode
    2632287
  • Title

    Computational complexity in logic testing

  • Author

    Sziray, József

  • Author_Institution
    Dept. of Inf., Szechenyi Univ., Gyo, Hungary
  • fYear
    2010
  • fDate
    5-7 May 2010
  • Firstpage
    97
  • Lastpage
    102
  • Abstract
    The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.
  • Keywords
    combinational circuits; computational complexity; digital circuits; fault diagnosis; logic testing; D-algorithm; NP-complete problems; combinational logic networks; composite justification; computational complexity; digital circuits; exponential time; fault detection tests; logic testing; stuck-at logic faults; test calculation problem; Algorithm design and analysis; Circuit faults; Circuit testing; Computational complexity; Digital circuits; Informatics; Logic testing; NP-complete problem; Polynomials; Turing machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Engineering Systems (INES), 2010 14th International Conference on
  • Conference_Location
    Las Palmas
  • Print_ISBN
    978-1-4244-7650-3
  • Type

    conf

  • DOI
    10.1109/INES.2010.5483865
  • Filename
    5483865