• DocumentCode
    2632641
  • Title

    A novel phase unwrapping algorithm and its application to phase stepped interferometry

  • Author

    Younus, Md Iqbal ; Hardie, Russell C. ; Blackshire, James

  • Author_Institution
    Dept. of Electr. Eng., Dayton Univ., OH, USA
  • fYear
    1998
  • fDate
    13-17 Jul 1998
  • Firstpage
    590
  • Lastpage
    595
  • Abstract
    Phase unwrapping is critical in the analysis of phase maps from a variety of interferometric systems. For some methods, an unwrapping error, due to noise, at some point can corrupt all subsequent phase demodulations from the corrupted point on. In images, this tends to lead to erroneous stripes in the phase demodulated data. We propose a novel phase unwrapping approach that uses a spatial binary tree image decomposition to allow maximum parallelism in implementation. At each node in the tree structure, a single unwrapping decision is made between two image blocks. The unwrapping rule used here is derived from a statistical estimate framework. Specifically, a maximum likelihood estimate of the demodulation term is used. This term can be viewed as that which minimizes a discontinuity penalizing cost function. We show that the algorithm exhibits robustness in presence of noise. The algorithm is demonstrated in a phase stepped interferometric system application
  • Keywords
    demodulation; electronic speckle pattern interferometry; maximum likelihood estimation; optical information processing; optical modulation; phase modulation; demodulation; discontinuity penalizing cost function; image decomposition; maximum likelihood estimate; parallelism; phase demodulation; phase maps; phase stepped interferometry; phase unwrapping; phase unwrapping algorithm; spatial binary tree; statistical estimate; unwrapping decision; unwrapping error; Application software; Computer errors; Demodulation; Educational institutions; Interferometry; Phase measurement; Pressure measurement; Robustness; Telephony; Wrapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
  • Conference_Location
    Dayton, OH
  • ISSN
    0547-3578
  • Print_ISBN
    0-7803-4449-9
  • Type

    conf

  • DOI
    10.1109/NAECON.1998.710210
  • Filename
    710210