DocumentCode
2632641
Title
A novel phase unwrapping algorithm and its application to phase stepped interferometry
Author
Younus, Md Iqbal ; Hardie, Russell C. ; Blackshire, James
Author_Institution
Dept. of Electr. Eng., Dayton Univ., OH, USA
fYear
1998
fDate
13-17 Jul 1998
Firstpage
590
Lastpage
595
Abstract
Phase unwrapping is critical in the analysis of phase maps from a variety of interferometric systems. For some methods, an unwrapping error, due to noise, at some point can corrupt all subsequent phase demodulations from the corrupted point on. In images, this tends to lead to erroneous stripes in the phase demodulated data. We propose a novel phase unwrapping approach that uses a spatial binary tree image decomposition to allow maximum parallelism in implementation. At each node in the tree structure, a single unwrapping decision is made between two image blocks. The unwrapping rule used here is derived from a statistical estimate framework. Specifically, a maximum likelihood estimate of the demodulation term is used. This term can be viewed as that which minimizes a discontinuity penalizing cost function. We show that the algorithm exhibits robustness in presence of noise. The algorithm is demonstrated in a phase stepped interferometric system application
Keywords
demodulation; electronic speckle pattern interferometry; maximum likelihood estimation; optical information processing; optical modulation; phase modulation; demodulation; discontinuity penalizing cost function; image decomposition; maximum likelihood estimate; parallelism; phase demodulation; phase maps; phase stepped interferometry; phase unwrapping; phase unwrapping algorithm; spatial binary tree; statistical estimate; unwrapping decision; unwrapping error; Application software; Computer errors; Demodulation; Educational institutions; Interferometry; Phase measurement; Pressure measurement; Robustness; Telephony; Wrapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location
Dayton, OH
ISSN
0547-3578
Print_ISBN
0-7803-4449-9
Type
conf
DOI
10.1109/NAECON.1998.710210
Filename
710210
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