• DocumentCode
    2632812
  • Title

    Path criticality computation in parameterized statistical timing analysis

  • Author

    Chung, Jaeyong ; Xiong, Jinjun ; Zolotov, Vladimir ; Abraham, Jacob A.

  • Author_Institution
    Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2011
  • fDate
    25-28 Jan. 2011
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    This paper presents a method to compute criticality probabilities of paths in parameterized statistical static timing analysis (SSTA). We partition the set of all the paths into several groups and formulate the path criticality into a joint probability of inequalities. Before evaluating the joint probability directly, we simplify the inequalities through algebraic elimination, handling topological correlation. Our proposed method uses conditional probabilities to obtain the joint probability, and statistics of random variables representing process parameters are changed due to given conditions. To calculate the conditional statistics of the random variables, we derive analytic formulas by extending Clark´s work. This allows us to obtain the conditional probability density function of a path delay, given the path is critical, as well as to compute criticality probabilities of paths. Our experimental results show that the proposed method provides 4.2X better accuracy on average in comparison to the state-of-art method.
  • Keywords
    VLSI; critical path analysis; delays; integrated circuit design; integrated circuit testing; probability; statistical analysis; Clark work; algebraic elimination; conditional probability density function; joint probability; parameterized statistical static timing analysis; path criticality computation; path delay; random variable; random variable statistics; topological correlation; Accuracy; Correlation; Delay; Joints; Random variables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4244-7515-5
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2011.5722192
  • Filename
    5722192