• DocumentCode
    2633124
  • Title

    Thermal models for semiconductors

  • Author

    van Duijsen, Peter ; Bauer, Pavol ; Leuchter, Jan

  • Author_Institution
    Simulation Res., Alphen aan den Rijn, Netherlands
  • fYear
    2010
  • fDate
    6-8 Sept. 2010
  • Abstract
    The power electronics circuits are seriously limited by the thermal ambience and therefore a detailed thermal design on power electronics is desirable. Especially the semiconductors are vulnerable to a high temperature and thermal cycling. The overview of power semiconductors switches as an effects of temperature are shown in this paper. In this paper the combined modeling and simulation of electrical and thermal behavior of semiconductors is discussed. The models for the semiconductors, being the MOSFET, IGBT and DIODE are briefly introduced and their most important parameters are highlighted. The thermal models for all semiconductors are discussed and how they are connected to the semiconductors. A series of measurements are shown for the MOSFET, IGBT and DIODE and these results are compared with simulations.
  • Keywords
    insulated gate bipolar transistors; power MOSFET; power semiconductor diodes; power semiconductor switches; semiconductor device models; IGBT; MOSFET; diode; electrical behavior; power electronics circuits; power semiconductor switches; semiconductors; thermal ambience; thermal models; Insulated gate bipolar transistors; Integrated circuit modeling; MOSFET circuits; Schottky diodes; Switches; Modelling; Power semiconductor device; Thermal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference (EPE/PEMC), 2010 14th International
  • Conference_Location
    Ohrid
  • Print_ISBN
    978-1-4244-7856-9
  • Type

    conf

  • DOI
    10.1109/EPEPEMC.2010.5606875
  • Filename
    5606875